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Volumn 106, Issue 7, 2006, Pages 620-629
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Interference electron microscopy of one-dimensional electron-optical phase objects
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Author keywords
Electron interferometry; Image simulation; Magnetic domains; p n junctions; Transmission electron microscopy
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Indexed keywords
COMPUTER SIMULATION;
GEOMETRICAL OPTICS;
IMAGE PROCESSING;
INTERFEROMETRY;
LIGHT INTERFERENCE;
MAGNETIC DOMAINS;
TRANSMISSION ELECTRON MICROSCOPY;
ELECTRON INTERFEROMETRY;
IMAGE SIMULATION;
P-N JUNCTIONS;
PARTIAL SPATIAL COHERENCE EFFECTS;
OPTICAL MATERIALS;
FERROMAGNETIC MATERIAL;
ARTICLE;
ELECTRON MICROSCOPY;
GEOMETRY;
IMAGE ANALYSIS;
MATHEMATICAL ANALYSIS;
PHASE CONTRAST MICROSCOPY;
SPIKE WAVE;
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EID: 33646769303
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2006.03.003 Document Type: Article |
Times cited : (4)
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References (20)
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