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Volumn 75, Issue 5, 2006, Pages

Holographic analysis of incident electron beam angular distribution of characteristic X-rays: Internal detector electron holography

Author keywords

Characteristic x rays; Crystal structure; Electron microscopy; Local structure; Photoelectron holography

Indexed keywords


EID: 33646708728     PISSN: 00319015     EISSN: 00319015     Source Type: Journal    
DOI: 10.1143/JPSJ.75.053601     Document Type: Article
Times cited : (8)

References (26)
  • 1
    • 0000952945 scopus 로고
    • Short Wavelength Coherent Radiation: Generation and Applications, ed. D. T. Attwood and J. Bokor (AIP, New York)
    • A. Szöke: in Short Wavelength Coherent Radiation: Generation and Applications, ed. D. T. Attwood and J. Bokor (AIP, New York, 1986) AIP Conf. Proc. No. 147, p. 361.
    • (1986) AIP Conf. Proc. No. 147 , pp. 361
    • Szöke, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.