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Volumn 75, Issue 5, 2006, Pages
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Holographic analysis of incident electron beam angular distribution of characteristic X-rays: Internal detector electron holography
a b c |
Author keywords
Characteristic x rays; Crystal structure; Electron microscopy; Local structure; Photoelectron holography
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Indexed keywords
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EID: 33646708728
PISSN: 00319015
EISSN: 00319015
Source Type: Journal
DOI: 10.1143/JPSJ.75.053601 Document Type: Article |
Times cited : (8)
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References (26)
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