Reply to the discussion by Sidney Diamond of the paper "Patch microstructure in cement-based materials: Fact or artefact?"

Cement and Concrete Research

Volumn 36, Issue 5, 2006, Pages 1002-1003

  Wong, H S ^a   Buenfeld, N R ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON MICROSCOPES; IMPREGNATION; MICROSTRUCTURE; POROSITY; TOPOLOGY;

EPOXY INTRUSION; HYDRATED CEMENT; PATCH MICROSTRUCTURE; SECONDARY ELECTRON (SE) IMAGE;

CONCRETE CONSTRUCTION;

EID: 33646707850     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cemconres.2006.02.005     Document Type: Note

References (7)

1. Diamond S. Percolation due to overlapping ITZs in laboratory mortars? A microstructural evaluation. Cem. Concr. Res. 33 7 (2003) 949-955
2. Diamond S. The microstructure of cement paste and concrete - a visual primer. Cem. Concr. Compos. 26 8 (2004) 919-933
3. H.S. Wong, N.R. Buenfeld, Patch microstructure in cement-based materials: Fact or artefact? Cem. Concr. Res.
4. Spurr A.R. A low-viscosity epoxy resin embedding medium for electron microscopy. J. Ultrastruct. Res. 26 1-2 (1969) 31-43
5. S. Diamond, A discussion of the paper "Patch microstructure in cement-based materials: Fact or artefact?" by H.S. Wong and N.R. Buenfeld, Cem. Concr. Res.
6. Kjellsen K.O., Monsøy A., Isachsen K., and Detwiler R.J. Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis - importance of epoxy impregnation. Cem. Concr. Res. 33 (2003) 611-616
7. Jakobsen U.H., Laugesen P., and Thaulow N. Determination of water-cement ratio in hardened concrete by optical fluorescence microscopy. In: Khan M.S. (Ed). Water-cement Ratio and Other Durability Parameters: Techniques for Determination, SP 191-3 (2000), ACI International, Los Angeles 27-41