Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis - Importance of epoxy impregnation

Cement and Concrete Research

Volumn 33, Issue 4, 2003, Pages 611-616

  Kjellsen, K O ^a   Monsoy A ^b   Isachsen, K ^b   Detwiler, R J ^c  

^a Norcem AS   (Norway)

^b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^c Structural and Architectural Engineering   (United States)

Author keywords

Backscattered electron imaging; EDX; Microstructure; SEM; Specimen preparation

Indexed keywords

BACKSCATTERING; ELECTRON SCATTERING; EPOXY RESINS; IMAGING TECHNIQUES; MICROANALYSIS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

BACKSCATTERED ELECTRON IMAGING;

CEMENTS;

EID: 0037399679     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0008-8846(02)01029-3     Document Type: Article

References (13)

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