XPS and RBS characterizations of electrosynthesized polypyrrole films doped with a heteropolyanion, SiMo12O404-

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 531-534

  Debiemme Chouvy, Catherine ^a   Bernard, Marie Claude ^a   Cachet, Hubert ^a   Deslouis, Claude ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

EQCM; Heteropolyanion; Polypyrrole; RBS; XPS

Indexed keywords

CHEMICAL ANALYSIS; CRYSTALS; DOPING (ADDITIVES); ELECTROCHEMISTRY; POLYMERS; QUARTZ; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROSYNTHESIS; EQCM; GALVANOSTATIC MODE; HETEROPOLYANION; POLYPYRROLE; RBS;

THIN FILMS;

EID: 33646594443     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2167     Document Type: Conference Paper

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