Quantification problems in depth profiling of PWR steels using Ar + ion sputtering and XPS analysis

Microscopy and Microanalysis

Volumn 12, Issue 5, 2006, Pages 432-437

  Ignatova, Velislava A ^a,c   Van Den Berghe, Sven ^a   Van Dyck, Steven ^a   Popok, Vladimir N ^b  

^a BELGIAN NUCLEAR RESEARCH CENTRE   (Belgium)

^b UNIVERSITY OF GOTHENBURG   (Sweden)

^c Fraunhofer Center Nanoelectronic Technologies   (Germany)

Author keywords

Erosion rate calibration; PWR steels; XPS depth profiling; XPS quantification

Indexed keywords

EID: 33750334599     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760606048X     Document Type: Article

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