Ripple structures developed on graphite layers during ion-sputtering

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 300-304

  Kovac J ^a   Zalar, A ^a   Pracek B ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

AES depth profiling; Graphite; Ion sputtering; Ripple structures; Ripples

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); ION BOMBARDMENT; NANOTECHNOLOGY; SPUTTERING; SURFACE ROUGHNESS;

AES DEPTH PROFILING; ION-SPUTTERING; RIPPLE STRUCTURES; RIPPLES;

GRAPHITE;

EID: 33646566561     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2280     Document Type: Conference Paper

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