Investigating low-frequency dielectric properties of a composite using the distribution of relaxation times technique

Philosophical Magazine

Volumn 86, Issue 16, 2006, Pages 2359-2369

  Tuncer, Enis ^a   Bowler, Nicola ^b   Youngs, I J ^c   Lymer, K P ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Iowa State University of Science and Technology   (United States)

^c DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

^d QINETIQ   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; DIELECTRIC PROPERTIES; MICROSTRUCTURE; PARAFFIN WAXES; RELAXATION PROCESSES; SPECTROSCOPIC ANALYSIS;

BROAD FREQUENCY RANGE; HOLLOW GLASS SPHERES; MICROSTRUCTURAL VARIATIONS; RELAXATION SPECTRA;

COMPOSITE MATERIALS;

EID: 33646525469     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430500527361     Document Type: Article

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