Probing carrier dynamics in implanted and annealed polycrystalline silicon thin films using white light

Applied Physics Letters

Volumn 88, Issue 18, 2006, Pages

  Lioudakis, Emmanouil ^a   Othonos, Andreas ^a   Nassiopoulou, A G ^b  

^a UNIVERSITY OF CYPRUS   (Cyprus)

^b INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFERENTIAL EQUATIONS; DIFFUSION; LASER PULSES; POLYCRYSTALLINE MATERIALS; SILICON; THIN FILMS;

ANNEALING TEMPERATURE; CARRIER DYNAMICS; LASER PULSE EXCITATION; PUMP-PROBE TECHNIQUE;

CARRIER CONCENTRATION;

EID: 33646521806     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2200745     Document Type: Article

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