On the value of static analysis for fault detection in software

IEEE Transactions on Software Engineering

Volumn 32, Issue 4, 2006, Pages 240-253

  Zheng, Jiang ^a   Williams, Laurie ^a   Nagappan, Nachiappan ^b   Snipes, Will ^c   Hudepohl, John P ^c   Vouk, Mladen A ^a  

^a North Carolina State University   (United States)

^b MICROSOFT RESEARCH   (United States)

^c NORTEL NETWORKS   (Canada)

Author keywords

Code inspections; Walkthroughs

Indexed keywords

HIGH-QUALITY SOFTWARE PRODUCT; ORTHOGONAL DEFECT CLASSIFICATION SCHEME; SOFTWARE FAULT DETECTION; STATIC ANALYSIS;

ALGORITHMS; COMPUTATIONAL COMPLEXITY; ERROR DETECTION; PERSONNEL; PROGRAM DEBUGGING; PROGRAM DIAGNOSTICS; QUALITY ASSURANCE; STATISTICAL METHODS;

COMPUTER AIDED SOFTWARE ENGINEERING;

EID: 33646501895     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSE.2006.38     Document Type: Article

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