Spinodal wrinkling in thin-film poly(ethylene oxide)/polystyrene bilayers

European Physical Journal E

Volumn 19, Issue 4, 2006, Pages 423-432

  Sharp, J S ^a   Vader, D ^b,c   Forrest, J A ^b   Smith, M I ^a   Khomenko, M ^b   Dalnoki Veress, K ^d  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b UNIVERSITY OF WATERLOO   (Canada)

^c HARVARD UNIVERSITY   (United States)

^d MCMASTER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; MELTING; MORPHOLOGY; OPTICAL MICROSCOPY; SURFACE ROUGHNESS; THERMAL EFFECTS; THIN FILMS;

MELTING TEMPERATURE; POLYETHYLENE OXIDE; PS CAPPING LAYERS; THIN-FILM BILAYERS;

POLYSTYRENES;

MACROGOL DERIVATIVE; POLYSTYRENE DERIVATIVE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; CRYSTALLIZATION; ELASTICITY; METHODOLOGY; SURFACE PROPERTY; TRANSITION TEMPERATURE;

COMPUTER SIMULATION; CRYSTALLIZATION; ELASTICITY; MEMBRANES, ARTIFICIAL; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; POLYETHYLENE GLYCOLS; POLYSTYRENES; SURFACE PROPERTIES; TRANSITION TEMPERATURE;

EID: 33646400851     PISSN: 12928941     EISSN: 1292895X     Source Type: Journal    
DOI: 10.1140/epje/i2005-10057-y     Document Type: Article

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