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Volumn 20, Issue 1, 2006, Pages 69-77

Dynamic process fault isolation by partial DPCA

Author keywords

Dynamic principal component analysis; Fault isolation; Partial PCA; Structured residual

Indexed keywords

BIOCHEMISTRY; COMPUTER SIMULATION; ELECTRIC FAULT LOCATION;

EID: 33646380635     PISSN: 03529568     EISSN: 03529568     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (17)
  • 6
    • 4444320697 scopus 로고    scopus 로고
    • Hangzhou, China
    • Li, R. Y., Rong, G., 5th WCICA, Hangzhou, China 2 (2004) 1680.
    • (2004) 5th WCICA , vol.2 , pp. 1680
    • Li, R.Y.1    Rong, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.