Design of an optimal plan for an accelerated degradation test: A case study

International Journal of Quality and Reliability Management

Volumn 23, Issue 4, 2006, Pages 426-440

  Li, Qishan ^a   Kececioglu, Dimitri B ^b  

^a University of Arizona ^*

^b University of Arizona   (United States)

Author keywords

Light emitting diodes; Measurement, testing and instruments

Indexed keywords

EID: 33646367917     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656710610657611     Document Type: Article

References (6)

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3. Meeker, W.Q., Escobar, L.A. and Lu, C.J. (1998), "Accelerated degradation tests: modeling and analysis", Technometrics, Vol. 40 No. 1, pp. 89-99.
4. Pinheiro, J.C. and Bates, D.M. (1995), "Approximations to the log-likelihood function in the nonlinear mixed-effects model", Journal of Computational and Graphical Statistics, Vol. 4 No. 1, pp. 12-35.
5. S-plus (2002), S-plus User's Guide, 500, Data Analysis Products Division, Mathsoft, Seattle, WA.
6. Ueda, O. (1996), Reliability and Degradation of III-V Optical Devices, Artech House, New York, NY.