High resolution studies of low-energy electron attachment to SF5Cl: Product anions and absolute cross sections

International Journal of Mass Spectrometry

Volumn 252, Issue 3, 2006, Pages 234-241

  Braun, M ^a   Ruf, M W ^a   Hotop, H ^a   Cicman, P ^b   Scheier, P ^b   Mark T D ^b   Illenberger, E ^c   Tuckett, R P ^d   Mayhew, C A ^d  

^a Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

^b Austria   (Austria)

^c FREIE UNIVERSITÄT BERLIN   (Germany)

^d UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Branching ratio; Cross section; Electron attachment; Mass spectrometry; SF5Cl

Indexed keywords

EID: 33646356195     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2006.03.008     Document Type: Article

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