Off-line combination of reversed-phase liquid chromatography and laser desorption/ionization time-of-flight mass spectrometry with seamless post-source decay fragment ion analysis for characterization of square-planar nickel(II) complexes

Journal of Mass Spectrometry

Volumn 41, Issue 4, 2006, Pages 448-453

  Řehulka, Pavel ^a   Popkov, Alexander ^b   Nádvorník, Milan ^c   Planeta, Josef ^a   Mazanec, Karel ^a   Chmelík, Josef ^a  

^a INSTITUTE OF ANALYTICAL CHEMISTRY   (Czech Republic)

^b UNIVERSITY OF SOUTH BOHEMIA   (Czech Republic)

^c UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

LDI TOF MS; Off line combination; RPLC; Seamless post source decay; Square planar nickel(II) complexes

Indexed keywords

AMINO ACIDS; COMPLEXATION; DESORPTION; IONIZATION; LASER BEAM EFFECTS; LIQUID CHROMATOGRAPHY; NICKEL; SEPARATION;

LDI-TOF MS; OFF-LINE COMBINATION; RPLC; SEAMLESS POST-SOURCE DECAY; SQUARE-PLANAR NICKEL(II) COMPLEXES;

MASS SPECTROMETRY;

AMIDE; METAL; NICKEL; SCHIFF BASE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL STRUCTURE; MATRIX ASSISTED LASER DESORPTION IONIZATION TIME OF FLIGHT MASS SPECTROMETRY; PRIORITY JOURNAL; REVERSED PHASE LIQUID CHROMATOGRAPHY; SEPARATION TECHNIQUE;

EID: 33646346360     PISSN: 10765174     EISSN: 10969888     Source Type: Journal    
DOI: 10.1002/jms.1000     Document Type: Article

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