Broad-band measurement for determining the complex permeability of thin films using microstrip line method

Gongneng Cailiao/Journal of Functional Materials

Volumn 37, Issue 2, 2006, Pages 191-193

  Peng, Xian Xu ^a   Jiang, Jian Jun ^a   Zhang, Xiu Cheng ^a   He, Hua Hui ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Complex permittivity; LabVIEW; Measurement; Microstrip line method; Thin films

Indexed keywords

ACOUSTIC MEASURING INSTRUMENTS; COBALT ALLOYS; IRON ALLOYS; MAGNETIC MATERIALS; MAGNETIC THIN FILMS; NANOSTRUCTURED MATERIALS;

BROAD-BAND MEASUREMENT; COMPLEX PERMITTIVITY; LABVIEW; MICROSTRIP LINE METHOD; MICROWAVE FREQUENCY;

MAGNETIC PERMEABILITY;

EID: 33646337450     PISSN: 10019731     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

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