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Volumn E89-C, Issue 4, 2006, Pages 517-519

Accurate small-signal modeling of FD-SOI MOSFETs

Author keywords

FD SOI; Modeling; MOSFET; Non quasi static; RF

Indexed keywords

COMPUTER SIMULATION; CURVE FITTING; MATHEMATICAL MODELS; PARAMETER ESTIMATION; SIGNAL PROCESSING; SILICON ON INSULATOR TECHNOLOGY;

EID: 33646272410     PISSN: 09168524     EISSN: 17451353     Source Type: Journal    
DOI: 10.1093/ietele/e89-c.4.517     Document Type: Article
Times cited : (5)

References (8)
  • 2
    • 0036564670 scopus 로고    scopus 로고
    • Linearity and low-noise performance of SOI MOSFETs for RF applications
    • May
    • A.O. Adan, T. Yoshimatsu, S. Shitara, N. Tanba, and M. Fukumi, "Linearity and low-noise performance of SOI MOSFETs for RF applications," IEEE Trans. Electron Devices, vol.49, no.5, pp.881-888, May 2002.
    • (2002) IEEE Trans. Electron Devices , vol.49 , Issue.5 , pp. 881-888
    • Adan, A.O.1    Yoshimatsu, T.2    Shitara, S.3    Tanba, N.4    Fukumi, M.5
  • 5
    • 84893724065 scopus 로고    scopus 로고
    • A new small signal modeling of RF MOSFETs including charge conservation capacitances
    • Sept.
    • I. Kwon, M. Je, K. Lee, and H. Shin, "A new small signal modeling of RF MOSFETs including charge conservation capacitances," Proc. European Solid-State Circuits Conference, pp.296-299, Sept. 2000.
    • (2000) Proc. European Solid-state Circuits Conference , pp. 296-299
    • Kwon, I.1    Je, M.2    Lee, K.3    Shin, H.4
  • 6
    • 0020918491 scopus 로고
    • The performance of submicrometer gate length GaAs MESFET's
    • Dec.
    • W.R. Curtice, "The performance of submicrometer gate length GaAs MESFET's," IEEE Trans. Electron Devices, vol.30, no. 12, pp. 1693-1699, Dec. 1983.
    • (1983) IEEE Trans. Electron Devices , vol.30 , Issue.12 , pp. 1693-1699
    • Curtice, W.R.1
  • 7
    • 0033879027 scopus 로고    scopus 로고
    • MOS transistor modeling for RF IC
    • Feb.
    • C.C. Enz and Y. Cheng, "MOS transistor modeling for RF IC," IEEE J. Solid-State Circuits, vol.35, no.2, pp.186-201, Feb. 2000.
    • (2000) IEEE J. Solid-state Circuits , vol.35 , Issue.2 , pp. 186-201
    • Enz, C.C.1    Cheng, Y.2
  • 8
    • 0035249128 scopus 로고    scopus 로고
    • High frequency characterization of gate resistance in RF MOSFETs
    • Feb.
    • Y. Cheng and M. Matloubian, "High frequency characterization of gate resistance in RF MOSFETs," IEEE Electron Device Lett., vol.22, no.2, pp.98-100, Feb. 2001.
    • (2001) IEEE Electron Device Lett. , vol.22 , Issue.2 , pp. 98-100
    • Cheng, Y.1    Matloubian, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.