A very low-noise single-electron electrometer of stacked-junction geometry

Physica B: Condensed Matter

Volumn 284-288, Issue PART II, 2000, Pages 1800-1801

  Krupenin, Vladimir A ^a   Presnov, Denis E ^a   Zorin, Alexander B ^a,b   Niemeyer, Jürgen ^b  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

Background charge noise; Coulomb blockade; Single electron tunneling

Indexed keywords

EID: 33646255101     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)02990-7     Document Type: Article

References (4)

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2. V.A. Krupenin et al., CPEM-98 Conference Digest, Washington, DC, USA July 6-10, 1998, p. 140; J. Appl. Phys. 48 (1998) 3212.
3. V.A. Krupenin et al., CPEM-98 Conference Digest, Washington, DC, USA July 6-10, 1998, p. 140; J. Appl. Phys. 48 (1998) 3212.
4. A.N. Korotkov, Phys. Rev. B 49 (1994) 10 381.