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Volumn 3712 LNCS, Issue , 2005, Pages 203-211
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Automatic test generation for N-way combinatorial testing
c
Southeast Univsity
*
(China)
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Author keywords
Combinatorial testing; Software testing; Test generation
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Indexed keywords
ALGORITHMS;
SYSTEMS ANALYSIS;
COMBINATORIAL TESTING;
SOFTWARE TESTING;
TEST GENERATION;
COMBINATORIAL CIRCUITS;
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EID: 33646204595
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/11558569_15 Document Type: Conference Paper |
Times cited : (20)
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References (8)
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