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Volumn 3712 LNCS, Issue , 2005, Pages 203-211

Automatic test generation for N-way combinatorial testing

Author keywords

Combinatorial testing; Software testing; Test generation

Indexed keywords

ALGORITHMS; SYSTEMS ANALYSIS;

EID: 33646204595     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11558569_15     Document Type: Conference Paper
Times cited : (20)

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    • In-parameter-order: A test generation strategy for pairwise testing
    • Dept. of Computer Science. North Carolina State Univ, Raleigh, North Carolina. Mar.
    • Y. Lei, K.C. Tai: In-Parameter-Order: A Test Generation Strategy for Pairwise Testing. Technical Report TR-2001-03. Dept. of Computer Science. North Carolina State Univ, Raleigh, North Carolina. Mar. 2001.
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    • Lei, Y.1    Tai, K.C.2
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  • 7
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    • Using artificial life techniques to generate test cases for combinatorial testing
    • Hong Kong, China. Sep.
    • S. Toshiaki, T. Tatsuhiro, K. Tohru: Using Artificial Life Techniques to Generate Test Cases for Combinatorial Testing. 28th Computer Software and Conference, Hong Kong, China. Sep. 2004.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.