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Volumn 32, Issue 1-2 SPEC. ISS., 2006, Pages 167-170
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Scanning a metallic tip close to a quantum point contact
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Author keywords
Quantum point contact; Scanning probe microscopy; Scanning gate microscopy
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Indexed keywords
ELECTRIC CONDUCTANCE;
METALLIC COMPOUNDS;
RESONANCE;
THERMAL EFFECTS;
QUANTUM POINT CONTACT;
SCANNING PROBE MICROSCOPY;
SCANNING-GATE MICROSCOPY;
QUANTUM THEORY;
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EID: 33646203421
PISSN: 13869477
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physe.2005.12.124 Document Type: Article |
Times cited : (4)
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References (9)
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