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Volumn 577, Issue 2-3, 2005, Pages 151-157
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Surface-diffusion-limited island decay on Rh(0 0 1)
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Author keywords
Low energy electron microscopy (LEEM); Rhodium; Single crystal surfaces; Surface diffusion; Surface structure, morphology, roughness and topography
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Indexed keywords
ACTIVATION ENERGY;
ANNEALING;
CONCENTRATION (PROCESS);
CONTAMINATION;
DIFFUSION;
ELECTRON MICROSCOPY;
ENTHALPY;
ENTROPY;
MASS TRANSFER;
MORPHOLOGY;
SINGLE CRYSTALS;
SURFACE ROUGHNESS;
SURFACE STRUCTURE;
SURFACE TOPOGRAPHY;
SURFACES;
LOW ENERGY ELECTRON MICROSCOPY (LEEM);
SINGLE CRYSTAL SURFACES;
SURFACE DIFFUSION;
SURFACE TRANSPORT;
RHODIUM COMPOUNDS;
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EID: 13844320086
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.01.003 Document Type: Article |
Times cited : (13)
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References (16)
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