Patch microstructure in cement-based materials: Fact or artefact?

Cement and Concrete Research

Volumn 36, Issue 5, 2006, Pages 990-997

  Wong, H S ^a   Buenfeld, N R ^a  

^a IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

Backscattered electron imaging (B); Image analysis (B); Interfacial transition zone (B); Microstructure (B); Percolation; SEM (B)

Indexed keywords

CONCRETES; IMAGE ANALYSIS; MICROSTRUCTURE; MORTAR; POROSITY; SCANNING ELECTRON MICROSCOPY;

BACKSCATTERED ELECTRON IMAGING (B); IMAGE ANALYSIS (B); INTERFACIAL TRANSITION ZONE (B); MICROSTRUCTURE (B); PERCOLATION; SEM (B);

CEMENTS;

EID: 33646100082     PISSN: 00088846     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cemconres.2006.02.008     Document Type: Article

References (11)

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