Sequential Monte Carlo for Bayesian matching of objects with occlusions

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 28, Issue 6, 2006, Pages 930-941

  Tamminen, Toni ^a   Lampinen, Jouko ^a  

^a AALTO UNIVERSITY   (Finland)

Author keywords

Monte Carlo simulation; Object recognition; Statistical models in pattern recognition

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; FEATURE EXTRACTION; MATHEMATICAL MODELS; MONTE CARLO METHODS; PATTERN MATCHING;

BAYESIAN FRAMEWORK; BAYESIAN MATCHING; BAYESIAN MODEL;

OBJECT RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BAYES THEOREM; BIOLOGICAL MODEL; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; INFORMATION RETRIEVAL; METHODOLOGY; MONTE CARLO METHOD; STATISTICAL MODEL;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BAYES THEOREM; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; MODELS, BIOLOGICAL; MODELS, STATISTICAL; MONTE CARLO METHOD; PATTERN RECOGNITION, AUTOMATED; SUBTRACTION TECHNIQUE;

EID: 33646029123     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2006.128     Document Type: Article

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