ETALONs for pure and composite transversal modes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6101, Issue , 2006, Pages

  Duparre M ^a   Ludge B ^a   Schroter S ^b  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^b Institut f Physikalische Hochtechnologie Jena   (Germany)

Author keywords

Characterization of spatial laser beam properties; Correlation filter; DOEs; Method of second order moments; Modal decomposition; Modal superposition

Indexed keywords

BOUNDARY CONDITIONS; DIFFRACTIVE OPTICS; FUNCTION EVALUATION; LASER APPLICATIONS; LASER BEAMS; METHOD OF MOMENTS; WAVEFRONTS;

CHARACTERIZATION OF SPATIAL LASER BEAM PROPERTIES; CORRELATION FILTER; DOES; METHOD OF SECOND ORDER MOMENTS; MODAL DECOMPOSITION; MODAL SUPERPOSITION;

ETALONS;

EID: 33645987649     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.647816     Document Type: Conference Paper

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