Self-organized CdSSe quantum dots thin films

Journal of Nanoscience and Nanotechnology

Volumn 6, Issue 3, 2006, Pages 731-737

  Chaure, Shweta ^a   Chaure, N B ^a   Pandey, R K ^b  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b BARKATULLAH UNIVERSITY   (India)

Author keywords

Absorption Spectroscopy; Atomic Force Microscopy; Photoluminescence; Quantum Dots; Wet Chemical route

Indexed keywords

ENERGY DISPERSIVE; GLASS SUBSTRATES; WET CHEMICAL ROUTE;

ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CADMIUM SULFIDE SOLAR CELLS; LIGHT ABSORPTION; PHOTOLUMINESCENCE; SOLID SOLUTIONS; THIN FILMS;

SEMICONDUCTOR QUANTUM DOTS;

CADMIUM DERIVATIVE; CADMIUM SELENIDE; CADMIUM SULFIDE; QUANTUM DOT; SELENIUM DERIVATIVE; SULFIDE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; LIGHT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; RADIATION EXPOSURE;

CADMIUM COMPOUNDS; CRYSTALLIZATION; LIGHT; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION; NANOTECHNOLOGY; PARTICLE SIZE; QUANTUM DOTS; SELENIUM COMPOUNDS; SULFIDES;

EID: 33645964007     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2006.101     Document Type: Article

References (31)

1. B. Pradhan, A. K. Sharma, and A. K. Ray, J. Nanosci. Nanotechnol. 5, 1130 (2005).
2. S. Chaure, N. B. Chaure, and R. K. Pandey, Physics E 28, 439 (2005).
3. R. Bakalova, Z. Zhelev, R. Jose, T. Nagase, H. Ohba, M. Ishikawa, and Y. Baba, J. Nanosci. Nanotechnol. 5, 887 (2005).
4. P. Gupta, B. Maiti, S. Chaudhiri, and A. K. Pal, Jpn. J. Appl. Phys. 344, 658 (1995).
5. O. Counio, T. Gacoin, and J. P. Boilot, J. Phys. Chem. B 102, 5227 (1998).
6. R. K. Jain and R. C. Lind, J. Opt. Soc. Am. 73, 647 (1983).
7. S. S. Yao, C. Karalagulleff, A. Gabel, R. Fortenberry, C. T. Seaton, and G. I. Stageman, Appl. Phys. Lett. 46, 801 (1985).
8. M. Mitsunaga, H. Shinomija, and K. Kubodera, J. Opt. Soc. Am. 85, 1448 (1987).
9. J. L. Liu, W. G. Wu, A. Balandin, G. Jin, and K. L. Wang, Appl. Phys. Lett. 74, 185 (1999).
10. E. Kumacheve, R. K. Golding, M. Allard, and E. H. Sargent, Adv. Mater. 14, 221 (2002).
11. J. Mazher, S. Badwe, R. Sengar, D. Gupta, and R. K. Pandey, Physica E 16, 209 (2003).
12. Y. Golan, G. Hodes, and I. Rubinstein, J. Phys. Chem. 100, 2220 (1996).
13. I. Druka and A. L. Barabasi, Appl. Phys. Lett. 72, 2102 (1998).
14. V. A. Shchukin, N. N. Ledentsov, P. S. Kopev, and D. Bimberg, Phys. Rev. Lett. 75, 2968 (1995).
15. J. Tersoff and F. K. Le Gouses, Phys. Rev. Lett. 72, 3570 (1994).
16. A. R. Woll, P. Rugheimer, and M. G. Lagally, Int. J. High Speed Electronics System 12, 45 (2002).
17. T. Kowalewski, M. A. Matchett, and W. E. Buhro, Atomic Force Microscopy/Scanning Tunneling Microscopy, edited by S. H. Cohen, M. T. Bray, and M. L. Lightbody, Plenum, New York (1994).
18. A. Avramescu, A. Veta, K. Uesugi, and I. Suemune, Jpn. J. Appl. Phys. 40, 1899 (2001).
19. T. Fujji, K. Imabori, H. Kawakatsu, S. Watanabe, and H. Bleuler, Nanotechnology 10, 380 (1990).
20. H. Ohtani, R. J. Wilson, S. Chiang, and C. M. Mate, Phys. Rev. Lett. 60, 2398 (1988).
21. L. Montelius, J. O. Tegenfeldt, and P. Van Heeran, J. Vac. Sci. Technol. B 12, 2222 (1994).
22. Y. J. Shin and A. Manthiram, Electrochemical and Solid State Letters 5, A55 (2002).
23. Y. Tian, T. Newton, A. Nicholas, M. Dirk, and H. F. Jenus, J. Phys. Chem. 100, 8927 (1996).
24. J. P. Kucznski, B. H. Milosaveljevic, and J. K. Thomas, J. Phys. Chem. 88, 980 (1984).
25. N. Chestnoy, T. D. Harris, R. Hull, and L. E. Brus, J. Phys. Chem. 90, 3393 (1986).
26. B. S. Kim, M. A. Islam, L. E. Brus, and I. P. Herman, J. Appl. Phys. 89, 8127 (2001).
27. H. Fu and A. Zunger, Phys. Rev. B 55, 1496 (1997).
28. M. Nirmal, D. J. Norris, M. Kuno, M. G. Bawendi, A. I. Lefros, and M. Rosen, Phys. Rev. Lett. 75, 3728 (1995).
29. H. C. Lin, J. Ou, C. H. Hsu, W. K. Chen, and M. C. Lee, Solid State Commun. 107, 547 (1998).
30. A. Fischer, I. Anthony, and A. D. Compaan, Appl. Phys. Lett. 72, 1822 (1984).
31. S. Pagliara, L. Sangalette, L. E. Depero, V. Capozzi, and G. Perna, Solid State Commun. 116, 115 (2000).