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Volumn 73, Issue 15, 2006, Pages

Spatial extent of band bending in diamond due to ion impact as measured by secondary electron emission: Experiment and theory

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EID: 33645789596     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.153202     Document Type: Article
Times cited : (8)

References (15)
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  • 5
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    • Ph.D. thesis, University of Melbourne
    • D. Hoxley, Ph.D. thesis, University of Melbourne, 2003.
    • (2003)
    • Hoxley, D.1
  • 6
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    • PRBMDO 0163-1829 10.1103/PhysRevB.45.12736
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    • Hoffman, A.1    Prawer, S.2    Kalish, R.3
  • 8
    • 84856129104 scopus 로고    scopus 로고
    • Technology Computer Aided Design (ISE-TCAD) semiconductor finite element modeling suite
    • Technology Computer Aided Design (ISE-TCAD) semiconductor finite element modeling suite, www.ise.com.
  • 9
    • 0001352040 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.64.165411
    • F. Maier, J. Ristein, and L. Ley, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.165411 64, 165411 (2001).
    • (2001) Phys. Rev. B , vol.64 , pp. 165411
    • Maier, F.1    Ristein, J.2    Ley, L.3
  • 10
    • 84856129105 scopus 로고    scopus 로고
    • Monte CArlo SImulation of electroN trajectory in sOlids (CASINO)
    • Monte CArlo SImulation of electroN trajectory in sOlids (CASINO), www.gel.usherb.ca/casino/.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.