Modeling of ultrasonic wave propagation in integrated piezoelectric structures under residual stress

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 53, Issue 4, 2006, Pages 685-695

  Lematre, Mickael ^a,b   Feuillard, Guy ^a,c   Delaunay, Thomas ^a   Lethiecq, Marc ^a  

^a UNIVERSITÉ DE TOURS   (France)

^b INSA CENTRE VAL DE LOIRE   (France)

^c French Society of Acoustics   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHRISTOFFEL TENSOR; LAMB MODES; PIEZOELECTRIC LAYERS; ULTRASONIC WAVE PROPAGATION; BULK PIEZOELECTRIC MATERIAL; CHRISTOFFEL EQUATION; COUPLING COEFFICIENT; INTEGRATED STRUCTURE; PIEZO-ELECTRIC STRUCTURES; PIEZOELECTRIC PLATE; THIN-FILM TECHNOLOGY;

LITHIUM NIOBATE; NUMERICAL ANALYSIS; PIEZOELECTRIC MATERIALS; RESIDUAL STRESSES; THIN FILMS; DISPERSIONS; PIEZOELECTRICITY; SURFACE WAVES;

ULTRASONIC PROPAGATION; RESIDUAL STRESSES;

EID: 33645693770     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2006.1611028     Document Type: Article

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