A sensitivity and linearity improvement of a 100 dB dynamic range CMOS image sensor using a lateral overflow integration capacitor

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn 2005, Issue , 2005, Pages 62-65

  Akahane, Nana ^a   Sugawa, Shigetoshi ^a   Adachi, Satoru ^b   Mori, Kazuya ^b   Ishiuchi, Toshiyuki ^b   Mizobuchi, Koichi ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b Texas Instruments Japan Ltd   (Japan)

Author keywords

Cmos image sensor; Dynamic range; Lateral overflow; Sensitivity and linearity

Indexed keywords

CMOS INTEGRATED CIRCUITS; IMAGE PROCESSING; MOS CAPACITORS; PHOTODIODES; SENSITIVITY ANALYSIS;

CMOS IMAGE SENSORS; DYNAMIC RANGE; LATERAL OVERFLOW; SENSITIVITY AND LINEARITY;

IMAGE SENSORS;

EID: 33645675169     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIC.2005.1469334     Document Type: Conference Paper

References (8)

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