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Journal of Applied Physics

Volumn 99, Issue 6, 2006, Pages

Excitons in electrostatic traps

(7) Hammack, A T a Gippius, N A a,c,d Yang, Sen a Andreev, G O a Butov, L V a Hanson, M b Gossard, A C b

a UNIVERSITY OF CALIFORNIA (United States)

b University of California (United States)

c PROKHOROV GENERAL PHYSICS INSTITUTE (Russian Federation)

d INST OF PHYS AND CHEMICAL RESEARCH (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATIC TRAPS; EXCITON DISSOCIATION; INDIRECT EXCITONS;

DISSOCIATION; ELECTRIC FIELD EFFECTS; ELECTRON TRAPS; ELECTROSTATICS; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM WELLS; VOLTAGE MEASUREMENT;

EXCITONS;

EID: 33645674132 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2181276 Document Type: Article

Times cited : (99)

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