Electrostatic exciton traps

Physica Status Solidi (A) Applied Research

Volumn 166, Issue 1, 1998, Pages

  Huber, T ^a   Zrenner, A ^a   Wegscheider, W ^a   Bichler, M ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EXCITONS; PHOTODIODES; PHOTOLUMINESCENCE; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS;

ELECTROSTATIC EXCITON TRAPS;

ELECTROSTATIC DEVICES;

EID: 0032023779     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199803)166:13.0.CO;2-6     Document Type: Article

References (1)

1. M. HAGN, A. ZRENNER, G. BÖHM, and G. WEIMANN, Appl. Phys. Lett. 67, 232 (1995).