Surface stress and reversing size effect in the initial yielding of ultrathin films

Journal of Applied Mechanics, Transactions ASME

Volumn 73, Issue 2, 2006, Pages 254-258

  Gioia, G ^a   Dai, X ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SIZE EFFECT; SURFACE STRESS; THIN FILM PROPERTIES; THIN FILM STRUCTURE;

GRAIN SIZE AND SHAPE; MECHANICAL PROPERTIES; STRESSES; SURFACE PROPERTIES; THICKNESS CONTROL; YIELD STRESS;

ULTRATHIN FILMS;

EID: 33645660513     PISSN: 00218936     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2074767     Document Type: Article

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