Structural studies of v2O5 nanowires by ultrahigh vacuum-scanning tunneling microscope and atomic force microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 3 B, 2006, Pages 2275-2277

  Kim, Yong Kwan ^a   Park, Sung Joon ^a   Lee, Hyeong Dong ^a   Kim, Gyu Tae ^a   Jeong Sook, H A ^a  

^a Korea University   (South Korea)

Author keywords

Atomic force microscopy; Scanning tunneling microscopy; Semiconducting wire; Sol gel synthesis; V2o5 nanowire

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CHARACTERISTICS; NANOSTRUCTURED MATERIALS; OXIDES; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SOL-GELS;

AMINOTHIOPHENOL (ATP); SEMICONDUCTING WIRES; SOL-GEL SYNTHESIS; V2O5 NANOWIRE;

VANADIUM COMPOUNDS;

EID: 33645538715     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.2275     Document Type: Article

References (8)

1. S. Frank, P. Poncharal, Z. L. Wang and W. A. de Heer: Science 280 (1998) 1744.
2. R. Saito, G. Dresselhaus and M. S. Dresselhaus; Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
3. J. Muster, G. T. Kim, V. Krstic, J. G. Park, Y. W. Park, S. Roth and M. Burghard: Adv. Mater. 12 (2000) 420.
4. G. T. Kim, J. Muster, V. Krstic, J. G. Park, Y. W. Park, S. Roth and M. Burghard: Appl. Phys. Lett. 76 (2000) 1875.
5. J. Livage:Coord. Chem. Rev. 178-180 (1998) 999.
6. Molecular Imaging, http://www.molec.com
7. T. Yao, Y. Oka and N. Yamamoto: Mater. Res. Bull. 27 (1992) 669.
8. J. K. Bailey, G. A. Pozarnsky and M. L. Mecartney: J. Mater. Res. 7 (1992) 2530.