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Volumn 45, Issue 3 B, 2006, Pages 2116-2118

Micro-radiographs stored in lithium fluoride films observed by scanning near-field optical microscopy

Author keywords

Lithium fluoride; Microradiography; SNOM

Indexed keywords

FLUORESCENCE; LITHIUM COMPOUNDS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; ULTRAVIOLET RADIATION; X RAY RADIOGRAPHY;

EID: 33645524584     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.2116     Document Type: Article
Times cited : (9)

References (18)
  • 1
    • 0001279871 scopus 로고    scopus 로고
    • Point Defects in Thin Insulating Films of Lithium Fluoride for Optical Microsystems, ed. H. S. Nalwa (Academic Press, San Diego)
    • R. M. Montereali: in Point Defects in Thin Insulating Films of Lithium Fluoride for Optical Microsystems, ed. H. S. Nalwa (Academic Press, San Diego, 2002) Handbook of Thin Film Materials, Vol. 3, p. 399.
    • (2002) Handbook of Thin Film Materials , vol.3 , pp. 399
    • Montereali, R.M.1
  • 12
    • 0003469907 scopus 로고
    • (Kluwer Academic, Dordrecht), NATO ASI Series E-242
    • D. W. Pohl and D. Courjon: Near Field Optics (Kluwer Academic, Dordrecht, 1993) NATO ASI Series E-242.
    • (1993) Near Field Optics
    • Pohl, D.W.1    Courjon, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.