Edge-raggedness evaluation using slanted-edge analysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6059, Issue , 2006, Pages

  Burns, Peter D ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

Edge raggedness; Normal edge profile; Slanted edge; Tangential edge profile

Indexed keywords

CAMERAS; FREQUENCY RESPONSE; IMAGE ANALYSIS; IMAGE QUALITY; OPTICAL TRANSFER FUNCTION; SCANNING;

EDGE RAGGEDNESS; NORMAL EDGE PROFILE; SLANTED EDGE; TANGENTIAL EDGE PROFILE;

EDGE DETECTION;

EID: 33645512279     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.649271     Document Type: Conference Paper

References (13)

1. J. C. Dainty and R. Shaw, Image Science, Ch. 7, Academic Press, London, 1974
2. J. R. Hammerly and R. M. Springer, "Raggedness of Edges," J. Opt. Soc. Amer., 71, pp. 285-288, 1981
3. R. Dooley and R. Shaw, J. Appl. Photo. Eng., 5, pp. 190, 1979
4. J. R. Hammerly, "An Analysis of Edge Raggedness and Blur," J. Appl. Photogr. Eng. 7: 148-151, 1981
5. P. G. Engeldrum, "Quality of Dot-Formed Images," Proc. SPIE, 310, pp. 118-124, 1981
6. S. E. Reichenbach, S. K. Park, and R. Narayanswamy, "Characterizing Digital Image Acquisition Devices," Opt. Eng., 30, pp. 170-177, 1991
7. ISO/TC WG18, Photography - Electronic still picture cameras - Resolution measurements, ISO, 1998
8. P. D. Burns and D. Williams, "Refined Slanted-Edge Measurement for Practical Camera and Scanner Testing," Proc. IS&T 2002 PICS Conf., IS&T, pp. 191-195, 2002
9. F. Scott, R. M. Scott, and R. V. Shack, "The Use of Edge Gradients in Determining Modulation-Transfer Functions," Photogr. Sc. Eng., 7, pp. 345-349, 1963
10. R. A. Jones, "An Automated Technique for Deriving MTFs from Edge Traces," Photogr. Sc. and Eng., 11, pp. 102-106, 1967
11. Ref. 1, pp. 244-246
12. ISO/IEC 13660, Information technology - Office equipment - Measurements of image quality attributes for hardcopy output - Binary monochrome text and graphic images, ISO 2001
13. J. C. Briggs, D. J. Forest, A. H. Klein and M-K. Tse, "Living with ISO-13660: Pleasures and Perils," Proc. IS&T's NIP 15 Conf., pp. 421-425, 1999