Measuring the stress in field-emitting carbon nanotubes

Nanotechnology

Volumn 17, Issue 8, 2006, Pages 1994-1998

  Wei, Wei ^a   Jiang, Kaili ^a   Wei, Yang ^a   Liu, Ming ^a   Yang, Haitao ^a   Zhang, Lina ^a   Li, Qunqing ^a   Liu, Liang ^a   Fan, Shoushan ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; FLAT PANEL DISPLAYS; MAXWELL EQUATIONS; SHORT CIRCUIT CURRENTS; STRESS ANALYSIS;

FIELD EMISSION; FIELD-EMITTING CNTS; MICRONS;

CARBON NANOTUBES;

EID: 33645288606     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/8/033     Document Type: Article

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