Remote metrology by comparative digital holography

Applied Optics

Volumn 45, Issue 5, 2006, Pages 925-934

  Baumbach, Torsten ^a   Osten, Wolfgang ^b   Von Kopylow, Christoph ^a   Jüptner, Werner ^a  

^a BIAS BREMER INSTITUT FÜR ANGEWANDTE STRAHLTECHNIK GMBH   (Germany)

^b UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT MODULATION; LIGHT MODULATORS; MICROSTRUCTURE; SENSITIVITY ANALYSIS;

DIGITAL HOLOGRAPHY; OPTICAL RECONSTRUCTION; SPATIAL LIGHT MODULATOR (SLM);

HOLOGRAPHY;

EID: 33645143340     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.000925     Document Type: Article

References (13)

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