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Volumn 45 B, Issue 2, 2006, Pages 169-194

Annealing and recrystallization of single crystals of polyethylene on graphite: An atomic force microscopy study

Author keywords

Epitaxial layer; High temperature AFM; Lamellar thickening; Melting; Recrystallization; Single crystals of PE; Single polymer layers

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; DRYING; EPITAXIAL GROWTH; GRAPHITE; INTERFACES (MATERIALS); MELTING; MORPHOLOGY; POLYMERS; SINGLE CRYSTALS; SOLUTIONS; SUBSTRATES;

EID: 33645108112     PISSN: 00222348     EISSN: 1525609X     Source Type: Journal    
DOI: 10.1080/00222340500522232     Document Type: Article
Times cited : (15)

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