Extended Hough transform for linear feature detection

Pattern Recognition

Volumn 39, Issue 6, 2006, Pages 1034-1043

  Cha, J ^a,d   Cofer, R H ^a,c   Kozaitis, S P ^a,b  

^a Florida Institute of Technology   (United States)

^b FLORIDA INSTITUTE OF TECHNOLOGY   (United States)

^c National Center for Health Statistics   (United States)

^d Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

Building extraction; Feature extraction; Hough transform; Pattern recognition

Indexed keywords

COMPUTATIONAL COMPLEXITY; FEATURE EXTRACTION; IMAGE SEGMENTATION; PARAMETER ESTIMATION; PATTERN RECOGNITION; PROBABILITY;

BUILDING EXTRACTION; CARTOGRAPHIC FEATURE DETECTION.;

HOUGH TRANSFORMS;

EID: 33644974942     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2005.05.014     Document Type: Article

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