Image chain assessment for feature extraction

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5108, Issue , 2003, Pages 287-294

  Cofer, R H ^a   Kozaitis, Samuel P ^a  

^a Florida Institute of Technology   (United States)

Author keywords

Bayesian detector; Feature extraction; Image chain

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; MATRIX ALGEBRA; SPURIOUS SIGNAL NOISE;

BAYESIAN DETECTORS; IMAGE CHAIN;

IMAGE SENSORS;

EID: 0344513910     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.487029     Document Type: Conference Paper

References (3)

1. nd Ed., John Wiley & Sons, 2001
2. R.T. Cox, Algebra of Probable Inference, John Hopkins University Press, 2001
3. Y. Viniotis, Probability and Random Processes for Electrical Engineers, McGraw Hill, 1998