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Volumn 26, Issue 12, 2005, Pages 85-88

Finite element analysis on reliability of soldered joint of J-lead

Author keywords

Finite element; Small outline J lead package; Soldered joint; Stress

Indexed keywords

COMPUTER SIMULATION; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; PRINTED CIRCUIT BOARDS; RELIABILITY; RIGIDITY; STRAIN; STRESSES; SURFACE MOUNT TECHNOLOGY; THERMODYNAMICS;

EID: 33644964131     PISSN: 0253360X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (12)
  • 1
    • 33644939864 scopus 로고    scopus 로고
    • Chinese source
  • 2
    • 0032027467 scopus 로고    scopus 로고
    • Thermal mechanical finite element analysis of problems in electronic packaging using the disturbed state concept
    • Basaran C, Desai C S, Kundu T. Thermal mechanical finite element analysis of problems in electronic packaging using the disturbed state concept[J]. ASEM Journal of Electronic Packaging, 1998, 120(2): 41-53.
    • (1998) ASEM Journal of Electronic Packaging , vol.120 , Issue.2 , pp. 41-53
    • Basaran, C.1    Desai, C.S.2    Kundu, T.3
  • 3
    • 5844348100 scopus 로고    scopus 로고
    • Sensitivity study on material properties for the fatigue life prediction of solder joints under cyclic thermal loading
    • Wei Shi, Lee Richey, Zhang Xiaowu. Sensitivity study on material properties for the fatigue life prediction of solder joints under cyclic thermal loading[J]. ASEM Advances in Electronic Packaging, 1997, (2): 1559-1566.
    • (1997) ASEM Advances in Electronic Packaging , Issue.2 , pp. 1559-1566
    • Wei, S.1    Lee, R.2    Zhang, X.3
  • 4
    • 33644932838 scopus 로고    scopus 로고
    • Chinese source
  • 5
    • 0031337348 scopus 로고    scopus 로고
    • Fatigue life prediction for thermally loaded solder joints using a volume-weighted averaging technique
    • Akay H U. Fatigue life prediction for thermally loaded solder joints using a volume-weighted averaging technique[J]. ASEM Journal of Electronic Packaging, 1997, 119(4): 228-235.
    • (1997) ASEM Journal of Electronic Packaging , vol.119 , Issue.4 , pp. 228-235
    • Akay, H.U.1
  • 6
    • 0031237439 scopus 로고    scopus 로고
    • Modeling thermally induced viscoplastic deformation and low cycle fatigue of CBGA solder joint in a surface mount package
    • Hong B Z, Burrell L G. Modeling thermally induced viscoplastic deformation and low cycle fatigue of CBGA solder joint in a surface mount package[J], IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1997, 20(3): 280-285.
    • (1997) IEEE Transactions on Components, Hybrids, and Manufacturing Technology , vol.20 , Issue.3 , pp. 280-285
    • Hong, B.Z.1    Burrell, L.G.2
  • 7
    • 33644948343 scopus 로고    scopus 로고
    • Chinese source
  • 9
    • 33644944203 scopus 로고    scopus 로고
    • Chinese source
  • 10
    • 33644943092 scopus 로고    scopus 로고
    • Chinese source
  • 11
    • 0031246745 scopus 로고    scopus 로고
    • Mechanical response of solder joints in flip-chip type structures
    • Soper A, Pozza G, Ignat M. Mechanical response of solder joints in flip-chip type structures[J]. Microelectronics and Reliability, 1997, 37: 1783-1786.
    • (1997) Microelectronics and Reliability , vol.37 , pp. 1783-1786
    • Soper, A.1    Pozza, G.2    Ignat, M.3
  • 12
    • 4243128360 scopus 로고    scopus 로고
    • Failure behavior of small outline J lead/Sn-X (X=AgCu or Pb) solder joints under thermal mechanical fatigue test
    • Pei Lin Wu, Meng Kuang Huang, Chiapyng Lee, et al. Failure behavior of small outline J lead/Sn-X (X=AgCu or Pb) solder joints under thermal mechanical fatigue test[J]. Materials Chemistry and Physics, 2004, 87: 285-291.
    • (2004) Materials Chemistry and Physics , vol.87 , pp. 285-291
    • Wu, P.L.1    Huang, M.K.2    Lee, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.