Quantitative analysis of crystal phases in glass-ceramics by X-ray diffraction method

Kuei Suan Jen Hsueh Pao/ Journal of the Chinese Ceramic Society

Volumn 33, Issue 12, 2005, Pages 1488-1493

  Lu, Yufeng ^a   Du, Yongguo ^a   Xiao, Jiayu ^a   Zhang, Chuanyu ^a   Zhang, Weijun ^a   Yin, Ruiming ^a  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

Author keywords

Crystallinity; Density; Glass ceramics; Rietveld method; Two phase model; X ray diffraction method

Indexed keywords

CRYSTAL STRUCTURE; DENSITY (SPECIFIC GRAVITY); X RAY DIFFRACTION;

CRYSTALLINITY; RIETVELD METHOD; TWO PHASE MODEL; X RAY DIFFRACTION METHOD;

GLASS CERAMICS;

EID: 33644952908     PISSN: 04545648     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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