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Volumn 35, Issue 2, 2006, Pages 257-265

Developing an analytic methodology to accurately predict probing depth in integrated circuit structures

Author keywords

Flip chip; Nanoindenter; Probe; Under bump metallurgy (UBM); Wafer

Indexed keywords

FLIP CHIP; NANOINDENTERS; UNDER BUMP METALLURGY (UBM); WAFERS;

EID: 33644931904     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02692444     Document Type: Conference Paper
Times cited : (9)

References (12)
  • 2
    • 85040875608 scopus 로고
    • Cambridge, United Kingdom: Cambridge University Press
    • K.L. Johnson, Contact Mechanics (Cambridge, United Kingdom: Cambridge University Press, 1985), pp. 56-70.
    • (1985) Contact Mechanics , pp. 56-70
    • Johnson, K.L.1
  • 10
    • 33644899525 scopus 로고    scopus 로고
    • "TestWorks 4 software for nanoindentation systems," version 012
    • Document No. D1418XPA-10629, Eden Prairie, MN: MTS Systems Corp.
    • "TestWorks 4 Software for Nanoindentation Systems," Version 012, Document No. D1418XPA-10629, MTS Manual (Eden Prairie, MN: MTS Systems Corp., 1999), pp. 1-65.
    • (1999) MTS Manual , pp. 1-65
  • 12
    • 33644911344 scopus 로고    scopus 로고
    • What is cobra™
    • Arlington Heights, IL: VTech Electronics North America, LLC
    • "What is Cobra™," VTech Japan Presentation Materials (Arlington Heights, IL: VTech Electronics North America, LLC, 2001).
    • (2001) VTech Japan Presentation Materials


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.