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Volumn 35, Issue 2, 2006, Pages 257-265
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Developing an analytic methodology to accurately predict probing depth in integrated circuit structures
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Author keywords
Flip chip; Nanoindenter; Probe; Under bump metallurgy (UBM); Wafer
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Indexed keywords
FLIP CHIP;
NANOINDENTERS;
UNDER BUMP METALLURGY (UBM);
WAFERS;
ALUMINUM;
ELASTIC MODULI;
ION BEAMS;
PROBES;
THIN FILMS;
INTEGRATED CIRCUITS;
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EID: 33644931904
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/BF02692444 Document Type: Conference Paper |
Times cited : (9)
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References (12)
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