Surface morphology and photoluminescence characteristics of Eu-doped YVO4 thin films

Optical Materials

Volumn 28, Issue 6-7, 2006, Pages 703-708

  Yi, Soung Soo ^a   Bae, Jong Seong ^b   Choi, Byung Chun ^b   Shim, Kyoo Sung ^b   Yang, Hyun Kyoung ^b   Moon, Byung Kee ^b   Jeong, Jung Hyun ^b   Kim, Jung Hwan ^c  

^a Silla University   (South Korea)

^b Pukyong National University   (South Korea)

^c Dong Eui University   (South Korea)

Author keywords

Photoluminescence (PL); Surface morphology; Thin film phosphors; YVO4:Eu3+

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); EUROPIUM; FILM GROWTH; MORPHOLOGY; PHOSPHORS; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

SUBSTRATE TEMPERATURE; THIN-FILM PHOSPHORS; YVO4:EU3+;

THIN FILMS;

EID: 33644918296     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2005.09.047     Document Type: Conference Paper

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