Single-exposure optical sectioning by color structured illumination microscopy

Optics Letters

Volumn 31, Issue 4, 2006, Pages 477-479

  Krzewina, Leo G ^a   Kim, Myung K ^a  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; COLORIMETRY; COMPUTER ASSISTED DIAGNOSIS; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; THREE DIMENSIONAL IMAGING;

ALGORITHMS; COLORIMETRY; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY;

COLOR GRID; STRUCTURED ILLUMINATION MICROSCOPY (SIM);

CAMERAS; CHARGE COUPLED DEVICES; DETECTORS; IMAGE PROCESSING; IMAGING TECHNIQUES;

OPTICAL MICROSCOPY;

EID: 33644915851     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.31.000477     Document Type: Article

References (5)

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