|
Volumn 28, Issue 6-7, 2006, Pages 836-841
|
Erbium-doped silicon nanocrystals grown by r.f. sputtering method: Competition between oxygen and silicon to get erbium
|
Author keywords
Erbium doping; nc Si; Optical properties; Spectroscopic ellipsometry; Thin films
|
Indexed keywords
HYDROGEN;
MICROSTRUCTURE;
NANOSTRUCTURED MATERIALS;
OXYGEN;
PHOTOLUMINESCENCE;
THIN FILMS;
ERBIUM-DOPING;
NC-SI;
SPECTROSCOPIC ELLIPSOMETRY;
SILICON;
|
EID: 33644913671
PISSN: 09253467
EISSN: None
Source Type: Journal
DOI: 10.1016/j.optmat.2005.09.035 Document Type: Conference Paper |
Times cited : (6)
|
References (15)
|