TEM image simulation study of small carbon nanotubes and carbon nanowire

Carbon

Volumn 44, Issue 7, 2006, Pages 1130-1136

  Hayashi, Takuya ^a   Muramatsu, Hiroyuki ^a   Kim, Yoong Ahm ^a   Kajitani, Hiroshi ^a   Imai, Shinji ^a   Kawakami, Hideyuki ^a   Kobayashi, Masamitsu ^a   Matoba, Toshiharu ^a   Endo, Morinobu ^a   Dresselhaus, Mildred S ^b  

^a SHINSHU UNIVERSITY   (Japan)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Carbon nanotubes; Microstructure; Transmission electron microscopy

Indexed keywords

CHARACTERIZATION; IMAGE ANALYSIS; MICROSTRUCTURE; SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

CARBON NANOWIRE; DEFOCUS CONDITION; GHOST FRINGES; MULTI-WALLED CARBON NANOTUBE (MWCNT);

CARBON NANOTUBES;

EID: 33644900218     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2005.11.017     Document Type: Article

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