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Volumn 55, Issue 1, 2006, Pages 7-17

Some properties of confidence bounds on reliability estimation for parts under varying stresses

Author keywords

Accelerated life test; Confidence interval; Cumulative damage model; Maximum likelihood estimation

Indexed keywords

ACCELERATED LIFE TEST; CUMULATIVE DAMAGE MODEL; RELIABILITY ESTIMATION; WEIBULL FAILURE TIME DISTRIBUTION;

EID: 33644898804     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2005.858091     Document Type: Article
Times cited : (6)

References (15)
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    • DeGroot, M.H.1    Goel, P.K.2
  • 2
    • 0019026625 scopus 로고
    • "Accelerated life testing-step-stress models and data analysis"
    • W. Nelson, "Accelerated life testing-step-stress models and data analysis," IEEE Transactions on Reliability, vol. R-29, no. 2, pp. 103-108, 1980.
    • (1980) IEEE Transactions on Reliability , vol.R-29 , Issue.2 , pp. 103-108
    • Nelson, W.1
  • 4
    • 0020734526 scopus 로고
    • "Optimum simple step-stress plans for accelerated life testing"
    • R. Miller and W. B. Nelson, "Optimum simple step-stress plans for accelerated life testing," IEEE Transactions on Reliability, vol. R-32, pp. 59-65, 1983.
    • (1983) IEEE Transactions on Reliability , vol.R-32 , pp. 59-65
    • Miller, R.1    Nelson, W.B.2
  • 10
    • 0023331397 scopus 로고
    • "Some aspects of accelerated life testing by progressive stress"
    • X. Yin and B. Sheng, "Some aspects of accelerated life testing by progressive stress," IEEE Transactions on Reliability, vol. R-36(1), pp. 150-155, 1987.
    • (1987) IEEE Transactions on Reliability , vol.R-36 , Issue.1 , pp. 150-155
    • Yin, X.1    Sheng, B.2
  • 11
    • 0036733183 scopus 로고    scopus 로고
    • "Performance of parameter estimates in step-stress accelerated life-tests with various sample sizes"
    • E. O. McSorley, J. C. Lu, and C. S. Li, "Performance of parameter estimates in step-stress accelerated life-tests with various sample sizes," IEEE Transactions on Reliability, vol. 51, pp. 271-277, 2002.
    • (2002) IEEE Transactions on Reliability , vol.51 , pp. 271-277
    • McSorley, E.O.1    Lu, J.C.2    Li, C.S.3
  • 12
    • 0025469769 scopus 로고
    • "Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests"
    • S. A. vander Wiel and W. Q. Meeker, "Accuracy of approx confidence bounds using censored Weibull regression data from accelerated life tests," IEEE Transactions on Reliability, vol. R-39(3), pp. 346-351, 1990.
    • (1990) IEEE Transactions on Reliability , vol.R-39 , Issue.3 , pp. 346-351
    • vander Wiel, S.A.1    Meeker, W.Q.2
  • 14
    • 0036604445 scopus 로고    scopus 로고
    • "Assessing high reliability via Bayesian approach and accelerated tests"
    • P. Erto and M. Giorgio, "Assessing high reliability via Bayesian approach and accelerated tests," Reliability Engineering and System Safety, vol. 76, pp. 301-310, 2002.
    • (2002) Reliability Engineering and System Safety , vol.76 , pp. 301-310
    • Erto, P.1    Giorgio, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.