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Volumn , Issue , 2005, Pages 229-232

Biaxial testing of thin functional structures used in flexible display and touch-screen applications

Author keywords

Bulge test; Critical onset biaxial strain; ITO; Polyethylene naphtalate (PEN) films

Indexed keywords

BRITTLENESS; CONDUCTIVE FILMS; DISPLAY DEVICES; ELECTRIC RESISTANCE MEASUREMENT; FLUORESCENT SCREENS; INDIUM COMPOUNDS; ORGANIC POLYMERS; STRAIN; TIN COMPOUNDS;

EID: 33644748297     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (1)

References (5)
  • 3
    • 0036457657 scopus 로고    scopus 로고
    • Failure test for brittle conductive layers on flexible display substrates
    • Failure test for brittle conductive layers on flexible display substrates. Piet C.P. Bouten, Eurodisplay 2002 (2002) 313
    • (2002) Eurodisplay 2002 , pp. 313
    • Bouten, P.C.P.1
  • 4
    • 0037040743 scopus 로고    scopus 로고
    • The fracture of brittle thin films on compliant substrates in flexible displays
    • The fracture of brittle thin films on compliant substrates in flexible displays. Zhong Chen, Brian Cotterel and Wei Wang. Engineering Fracture Mechanics 69 (2002) 597-603
    • (2002) Engineering Fracture Mechanics , vol.69 , pp. 597-603
    • Chen, Z.1    Cotterel, B.2    Wang, W.3
  • 5
    • 0002310405 scopus 로고
    • edited by C.A. Neugebauer, J.B. Newkirk and D.A. Vermilyea (John Wiley and Sons, New York)
    • Structure and Properties of Thin Films, J.W. Beams, edited by C.A. Neugebauer, J.B. Newkirk and D.A. Vermilyea (John Wiley and Sons, New York, 1959) p. 183
    • (1959) Structure and Properties of Thin Films , pp. 183
    • Beams, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.