On the dependence of the Nernst diffusion layer thickness on potential and sweep rate for reversible and of the thickness of the charge transfer layer for irreversible processes studied by application of the linear potential sweep method

Electrochimica Acta

Volumn 51, Issue 14, 2006, Pages 2971-2976

  Velasco, Jaime González ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Charge transfer layer thickness; Conductance; Diffusion layer thickness; Irreversible and reversible electron transfer; Linear sweep voltammetry

Indexed keywords

CHARGE TRANSFER; CYCLIC VOLTAMMETRY; ELECTRIC CONDUCTANCE; ELECTRON TRANSPORT PROPERTIES;

CHARGE TRANSFER LAYER THICKNESS; DIFFUSION LAYER THICKNESS; LINEAR SWEEP VOLTAMMETRY;

DIFFUSION;

EID: 33644696661     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2005.08.028     Document Type: Note

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