Analysis of the diffusion layer thickness, equivalent circuit and conductance behaviour for reversible electron transfer processes in linear sweep voltammetry

Electrochimica Acta

Volumn 49, Issue 3, 2004, Pages 445-453

  Arun Prasad, M ^a   Sangaranarayanan, M V ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Current function; Diffusion layer thickness; Equivalent circuit; Linear sweep voltammetry; Reversible electron transfer

Indexed keywords

DIFFUSION IN SOLIDS; ELECTRIC CONDUCTANCE; ELECTRODES; EQUIVALENT CIRCUITS; PARAMETER ESTIMATION; PERTURBATION TECHNIQUES;

CURRENT FUNCTIONS; LINEAR SWEEP VOLTAMMETRY;

ELECTRON TRANSITIONS;

EID: 0344924942     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2003.05.003     Document Type: Article

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